- Top lighting for easier measurement of samples of differing thickness.
- Auto-height sample positioning with laser guiding.
- Auto spot search for precise test point alignment.
- Precision positioning sample holder.
- Micro Collimator for improved testing accuracy.
- Point and click by mouse test point determination.
Si-PIN Semiconductor Detector.
Measurement of up to 5 plating layers.
Micro collimator to improve testing accuracy.